ŻҲϩ(/ע/ë/)漼
ԹعݲʳظŻҥƥ칶 ŻҲϩ)ϡLSI(絬ϽѲϩ), ŻҲϩѥ쥯ȥ˥˴ؤ븦ԤʤäƤޤEnglish
Ƴ
- 2022ǯٸ漼°
//ע/ë/ĤǡֽѲϩѥ쥯ȥ˥ץ롼פ ޤȤ°˾ޤ
- 2022ǯǸ漼Ҳ𥹥饤
- lab_intro_short_2022_overall.pdf(503) (2022ǯ)
- Ӹ
- lab_intro_short_2022.pdf(287) (2022ǯ)
- עڸ
- lab_intro_hiroki_2022.pdf(288) (2022ǯ)
- 漼
2022/4/4, 4/5, 4/6 10:30, 13:005-302˽ (1). ؼԤ¿ξϼ˲äƤ餦Ȥ⤢ޤ
- 漼°Խ
2022/4/11() 13:005-302
- 2022/3/25 СꥹȤ2022ǯ٤˲ޤ
- 2022/3/10 M1Σ̾IEICE Ĺ ޤޤ
- 2022/3/1 ëڶǤޤ
ơ
ơޤϲ̤Ǥ
- LSIο ޥˤ
- NBTI(Negative Bias Temperature Instability)ˤ롢LSIηǯ
- եȥ顼ˤLSIΰξ(BP Tech-On)
- ѥ쥯ȥ˥
- SiC/GaNȥɥ饤Фγȯ
- GaNѤѥѲϩ
- ˥塼եåԥ塼ƥ
- MOSFETߥ졼
¾LSI/ŻҲϩ/ѥ泌˴ؤ뤳
եȥ顼Ϣ
Ĺط
- Tibor Grasser ֱ(2015/8/24)
- RASEDAǤξԹֱ "Defect-Oriented Degradations in Recent VLSIs: Random Telegraph Noise, Bias Temperature Instability and Total Ionizing Dose" 饤RASEDA_INVITED_public.pdf(1442)
ȯɽʸ´
Ʊ
ŻҲϩؤǤϡ¼ҲΩĸƤޤθƤ¿ζƱԤʤäƤޤ2021ǯζƱ/ϲΤȤǤ
- ưָȾƳ2
- SoC߷2
- ȾƳ¤1
漼Ǥ
- ϡ´ΤγϽ˸ơưԤʤޤޤӸǤϡгȯɽѶŪ˹ԤʤäƤޤϤȤꡢƹ衼åѤʤϤǼʬθƤȯɽ뤳ȤǤޤ
- 漼Ǥϡ1θǤ碌˳ĿͤȤǤ碌ǯθ漼Ǥθȯɽʤɤ̤ơθǽϤᤤƤޤ
/ʳؾ
ʳؾ
- 2009ǯ
- 4̾4Τ2̾ر˿ʳ
- 2010ǯ
- 4̾4٤Ƥȡ2009ǯ˿ʳؤǤʤä2̾ر˿ʳ
- 2011ǯ
- 2̾νβ˾Ԥ1̾θ˾Ԥ줾ʳ
- 2012ǯ
- 2̾νβ˾Ԥ1̾θ˾Ԥ줾ʳ
- 2013ǯ
- 3̾νβ˾Ԥʳ
- 2014ǯ
- 3̾νβ˾Ԥ1̾θ˾Ԥ줾줬ʳ
- 2015ǯ
- 3̾νβ˾Ԥʳ
- 2016ǯ
- 2̾νβ˾Ԥʳ
- 2017ǯ
- 6̾νβ˾Ԥʳ
- 2018ǯ
- 8̾νβ˾Ԥʳ
- 2019ǯ
- 7̾νβ˾Ԥʳ
- 2020ǯ
- 8̾νβ˾Ԥʳ
- 2010ǯ
- 21̾LSI˽, üʳصѲ4ߥ˥ƥFMɤ˽.
- 2011ǯ
- 21̾LSI˽, 42̾ʤ1̾üʳصѲˤ˽
- 2012ǯ
- 24̾ŵ, LSI˽.
- 2013ǯ
- 22̾ŵŴƻҤ˽
- 2014ǯ
- 21̾ŵ˽
- 2015ǯ
- 23̾ŵ֥IT塼ץХ˽
- 2016ǯ
- 22̾LSIߵҤ˽ݥɥưȾƳΥ˽
- 2017ǯ
- 23̾LSIŵȾƳ߷ײҤ˽θ´Ωؽ˽Ǥ
- 2018ǯ
- 22̾ư֥ѥ쥯ȥ˥˽
- 2019ǯ
- 26̾ ȾƳ¤֥ Żҵ ŵ˽
- 2020ǯ
- 28̾ ȾƳΥ Żҵ ե֥쥹ȾƳ߷ײҡ ⷿ ˽
Թؾꥭѥ5301-306 401A-B/ע/ë/ĸ漼Ǥ
- 302, 305, 401B漼(漼)Ǥϡ1Υ饤LinuxüȤäơߥ졼ϩ߷סʸʤɤԤʤޤޤߡƥڡǤϡǤ碌ʤɤԤʤޤ
- 301, 306漼(¸)ǤϡLSIƥʤɤγƼ¬ȤäLSI¬ʤɤԤʤޤ