The Second International Symposium on Reliability

About this Symposium
It is the second symposium in Japan about reliability issues related to electronics such as soft errors, aging degradations to threaten our safety, which consists of the keynote and several invited talks by distinguished researchers from all over the world. The first symposium was held in 2018, which was a great success. See here for details.
General and Program Chair
Prof. Kazutohi Kobayashi (Kyoto Insititute of Technology)
Sponsor
Green Innovation Lab, Kyoto Institute of Technology

Cooperation
Consortium for "Quantum Innovation for Safe, Secure, Smart Society (QISS)" supported by JST OPERA. Home page (In Japanese)

http://www.ieee-jp.org/section/kansai/chapter/sscs/IEEE SSCS Kansai Chapter, IEEE EDS Kansai Chapter

Date& Time
10:00-18:00 (Tentative), Friday, March 13th, 2020
Venue
60th Anniversary Hall, Kyoto Institute of Technology, Matsugasaki, Sakyo-Ku, Kyoto, 606-8585 Japan
Registration
Advance Registaration is recommended. Will be available on Dec. 2019.
Registration Fee
Free of charge except for Reception

Keynote and Invited Speakers

Must come:

Tentative:
Information for the last symposium in 2018 is here
kazutoshi.kobayashi at kit.ac.jp
Last modified: Wed Oct 30 09:59:01 JST 2019