Tibor Grasser received his Ph.D. degree in technical sciences from the TU Wien where he is currently employed as an Associate Professor. In 2003 he was appointed director of the Christian Doppler Laboratory for TCAD in Microelectronics. Dr. Grasser is the co-author or author of more than 500 scientific articles, editor of books on advanced device simulation, the bias temperature instability (Springer), and hot carrier degradation (Springer), a distinguished lecturer of the IEEE Electron Devices Society, a senior member of IEEE, has been involved in various functions at outstanding conferences such as IEDM, IRPS, SISPAD, IWCE, ESSDERC, IIRW, and ISDRS, is a recipient of the Best and Outstanding Paper Awards at IRPS (2008, 2010, 2012, and 2014), IPFA (2013), ESREF (2008) and the IEEE EDS Paul Rappaport Award (2011). He was also a chairman of SISPAD 2007 and General Chair of IIRW 2014 and currently serves as an Associate Editor for Microelectronics Reliability (Elsevier).